Contact the SEE User Manager for general information and to request booking.

FRIB Single Event Effects facilities

FRIB’s facilities, including the FRIB Single Event Effects Facility (FSEE) and the K500 Chip Testing Facility (KSEE), are essential in addressing the national shortage of testing capacity for advanced microelectronics used in industries like spaceflight, wireless technology, and autonomous vehicles.

The FRIB Single Event Effects facilities, established by the U.S. Department of Defense, provide U.S.-based users with heavy ion beams, accurate characterization of beam parameters and linear energy transfers (LETs), easy-to-use controls, and prompt reporting of dosimetry results.

FSEE is based on the FRIB superconducting linac, while KSEE is based on the K500 cyclotron. They provide similar beams and energies. 

FSEE beam list and ion cocktails

Utilizing FRIB's state-of-the-art accelerators, the SEE facilities let users fulfill an extensive range of experimental needs. Below is the current beam list and ion cocktails offered.

FSEE available beam list (updated June 2025)

FSEE ion range & linear energy transfer (updated June 2025)

The FSEE Facility has a dedicated beamline built on the FRIB linac infrastructure. A user experimental station is established at the end of each SEE beamline. A thin vacuum window defines the exposure area of the beam; either one-inch (FSEE) or two-inch (KSEE). A 4-degree-of-freedom stage allows for samples to be mounted and accurately positioned. A user control room is located nearby which houses robust industrial software controls, control for device presentation to the beam, and real-time monitoring of dose statistics. 
 

KSEE beam list 

KSEE available beam list (updated June 2025)

KSEE nominal and maximum LET values (updated June 2025)

Facility differences