Heavy-Ion Facilities
FRIB’s heavy-ion facilities, including the FRIB Single Event Effects Facility (FSEE) and the K500 Chip Testing Facility (KSEE), address the national shortage of testing capacity for advanced microelectronics.
To book time, contact the SEE User Manager.
Contact the SEE User Manager for general information and questions.
FRIB Single Event Effects facilities
FRIB’s facilities, including the FRIB Single Event Effects Facility (FSEE) and the K500 Chip Testing Facility (KSEE), are essential in addressing the national shortage of testing capacity for advanced microelectronics used in industries like spaceflight, wireless technology, and autonomous vehicles.
The FRIB SEE facilities, established with financial support from the federal government, provide U.S.-based users with heavy ion beams, accurate characterization of beam parameters and linear energy transfers, easy-to-use controls, and prompt reporting of dosimetry results.
FSEE is based on the FRIB superconducting linac, while KSEE is based on the K500 cyclotron. They provide similar beams and energies.
FSEE details
View FSEE beam list and specifications, availability, and booking information.
KSEE details
View KSEE beam list and specifications, availability, and booking information.
Facility differences
| Value | KSEE | FSEE |
|---|---|---|
| Ion Species | Refer to Beamlist | Refer to Beamlist |
| Beam Energies | Refer to Beamlist | Refer to Beamlist |
| Beam Size | 40 x 40 mm2 | 20 x 20 mm2 |
| Beam Format | CW | CW, Pulsed up to 1E12 pps/cm2 |
| Average Uniformity | >90% | >90% |
| PEN Window Thickness | 76.2 μm | 101 μm |
| Degrader System | Internal | External |
| Stage Range of Motion x/y | +/- 7.5 in | +/- 7.5 in |
| Stage Range of Motion z | 210 mm | 190 mm |
| Stage Weight Limit | 30 lbs | 30 lbs |
| Local Available Power | AC 120V-15A | AC 120V-15A |
| Local Available Airflow | 80 Psi | 80 Psi |
| Cat6 Patch Connections | 20 | 20 |
| Coax Patch Connections | 5 | 5 |
| 9pin Patch Connections | 4 | 4 |
| Fiber Patch Connections | 6 - Multi Mode (Future) | 12 - Single Mode |
| Species Change Time | <30 Minutes | 1-2 Hours |
| Energy Change Time | 1 Hour | 30-60 Minutes |
| Flux Change Time (CW) | <10 Minutes | 1-15 Minutes |
| Flux Change Time (Pulse) | N/A | <1 Minute |
SEE downloads
View current downloadable files relevant to the SEE facilities like beamlists and technical drawings.
